Accounting for partiality in serial crystallography using ray‐tracing principles
Publisher： John Wiley & Sons Inc
E-ISSN： 1399-0047|71|9|1799-1811
ISSN： 0907-4449
Source： ACTA CRYSTALLOGRAPHICA SECTION D (ELECTRONIC), Vol.71, Iss.9, 2015-09, pp. : 1799-1811
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