Defects in wide band-gap semiconductors: selective etching and calibration by complementary methods

Author: Weyher J. L.   Macht L.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|27|1-3|37-41

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.27, Iss.1-3, 2010-03, pp. : 37-41

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Abstract