Effect of high pressure-temperature on silicon layered structures as determined by X-ray diffraction and electron microscopy

Author: Bak-Misiuk J.   Misiuk A.   Ratajczak J.   Shalimov A.   Antonova I.   Trela J.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|27|1-3|415-418

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.27, Iss.1-3, 2010-03, pp. : 415-418

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Abstract