Transmission electron microscopy of NdNiO3 thin films on silicon substrates

Author: Laffez P.   Retoux R.   Boullay P.   Zaghrioui M.   Lacorre P.   van Tendeloo G.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|12|1|55-60

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.12, Iss.1, 2010-03, pp. : 55-60

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Abstract