Raman investigation of stress and phase transformation induced in silicon by indentation at high temperatures

Author: Kouteva-Arguirova S.   Orlov V.   Seifert W.   Reif J.   Richter H.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|27|1-3|279-283

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.27, Iss.1-3, 2010-03, pp. : 279-283

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Abstract