A comparative study of radiation damage on high resistivity silicon

Author： Mangiagalli P. Levalois M. Marie P. Rancoita P. G. Rattaggi M.

E-ISSN： 1286-0050|6|2|121-130

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.6, Iss.2, 2010-03, pp. : 121-130

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