Phase thickness approach for determination of thin film refractive index dispersion from transmittance spectra

Author： Nenkov M. R.   Pencheva T. G.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|42|3|219-228

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.42, Iss.3, 2008-04, pp. : 219-228

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