On absorption by non-axially excitedslabs of dielectric thin-film helicoidal bianisotropic mediums

By Venugopal V. C.   Lakhtakia A.  

EPJ Applied Physics (The), Vol. 10, Iss. 3, 2010-03 ,pp. : 173-184

Edp Sciences

Access to resources Recommend Favorite

Spectral signatures of axiallyexcited slabs of dielectric thin-film helicoidal bianisotropic mediums

By Lakhtakia A.  

EPJ Applied Physics (The), Vol. 8, Iss. 2, 2010-03 ,pp. : 129-137

Edp Sciences

Access to resources Recommend Favorite

Phase thickness approach for determination of thin film refractive index dispersion from transmittance spectra

By Nenkov M. R.   Pencheva T. G.  

EPJ Applied Physics (The), Vol. 42, Iss. 3, 2008-04 ,pp. : 219-228

Edp Sciences

Access to resources Recommend Favorite

Effect of film thickness and deposition rate on the AC electrical conductivity and dielectric properties of Sb_xS_1−x thin films

By El-Shazly A. A.   El-Samanoudy M. M.   Seyam M. A. M.   Ammar A. H.   Assim E. M.  

EPJ Applied Physics (The), Vol. 21, Iss. 3, 2002-12 ,pp. : 225-231

Edp Sciences

Access to resources Recommend Favorite

Dielectric properties of (Ba_0.67Sr_0.33)TiO₃ thin film for uncooled infrared focal plane arrays

By S. J. Liu   C. Y. Xu   X. B. Zeng   B. F. Zhao  

EPJ Applied Physics (The), Vol. 19, Iss. 3, 2002-09 ,pp. : 181-183

Edp Sciences

Access to resources Recommend Favorite