Study of Ag porous film using X-ray reflectivity and pattern formationusing Atomic Force Microscope

Author: Banerjee S.   Mukherjee S.   Kundu S.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|17|2|99-106

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.17, Iss.2, 2010-03, pp. : 99-106

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Abstract