Author： Salah Fethi Harzallah Besma Mérian Thiphaine Debarnot Dominique Poncin-Epaillard Fabienne van der Lee Arie
Publisher： Edp Sciences
E-ISSN： 1286-0050|62|1|10304-10304
ISSN： 1286-0042
Source： EPJ Applied Physics (The), Vol.62, Iss.1, 2013-04, pp. : 10304-10304
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
The possibilities for extracting chemical composition-related information from a singlewavelength X-ray reflectometry experiment are investigated. It is shown that the X-ray absorption of certain elements is sufficient to cause a significant effect on the reflectivity curve, which can be in turn exploited to determine its abundance in the thin film. The limitations are discussed using simulated data and the methodology is applied for the determination of the iodine concentration in iodine-treated thin polyaniline films. More generally the method appears to be very sensitive for the non-destructive determination of the weight percentage of metal nanoparticles in thin polymer films.
Related content
Chemical analysis using X-ray and electron spectroscopies
By Esnouf C.
Revue de Métallurgie, Vol. 100, Iss. 5, 2010-03 ,pp. :
Access to resources
Recommend
By Figueiredo Maria-Ondina da Silva Teresa Pereira de Oliveira Daniel Rosa Diogo
Minerals, Vol. 2, Iss. 4, 2012-11 ,pp. :
Access to resources