Atomic force microscopy of twin formationin low-stacking fault CuAl alloy

Author： Coupeau C.   Tranchant F.   Vergnol J.   Grilhé J.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|6|1|1-6

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.6, Iss.1, 2010-03, pp. : 1-6

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