Force sensing and mapping by atomic force microscopy

Author： Green N.H.   Allen S.   Davies M.C.   Roberts C.J.   Tendler S.J.B.   Williams P.M.  

Publisher： Elsevier

ISSN： 0165-9936

Source： TrAC Trends in Analytical Chemistry, Vol.21, Iss.1, 2002-01, pp. : 65-74

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