Hall effect sensors integrated in standard technology and optimized with on-chip circuitry*

Author: Kammerer J.-B.   Hébrard L.   Frick V.   Poure P.   Braun F.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|36|1|49-64

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.36, Iss.1, 2006-10, pp. : 49-64

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Abstract