Author: Bourguiga R. Horowitz G. Garnier F. Hajlaoui R. Jemai S. Bouchriha H.
Publisher: Edp Sciences
E-ISSN: 1286-0050|19|2|117-122
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.19, Iss.2, 2002-07, pp. : 117-122
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Mansouri S. Mahdouani M. Oudir A. Zorai S. Ben Dkhil S. Horowitz G. Bourguiga R.
EPJ Applied Physics (The), Vol. 48, Iss. 3, 2009-10 ,pp. :
Low frequency noise modeling of polycrystalline silicon thin-film transistors
EPJ Applied Physics (The), Vol. 48, Iss. 1, 2009-07 ,pp. :