Characterization of Ta2O5 thin films prepared by reactive evaporation

Author: Asghar M. H.   Placido F.   Naseem S.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|36|2|119-124

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.36, Iss.2, 2006-10, pp. : 119-124

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Abstract