Epitaxial CeO2 thin films for a mechanism study of resistive random access memory (ReRAM)

Author： Yoshitake Michiko   Vaclavu Michal   Chundak Mykhailo   Matolin Vladimir   Chikyow Toyohiro  

Publisher： Springer Publishing Company

ISSN： 1432-8488

Source： Journal of Solid State Electrochemistry, Vol.17, Iss.12, 2013-12, pp. : 3137-3144

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