![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Yu Hyeongwoo Kim Minho Kim Yoonsu Lee Jeongsup Kim Kyoung-Kook Choi Sang-Jun Cho Soohaeng
Publisher: Springer Publishing Company
ISSN: 1738-8090
Source: Electronic Materials Letters, Vol.10, Iss.2, 2014-03, pp. : 321-324
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Macco B Deligiannis D Smit S van Swaaij R A C M M Zeman M Kessels W M M
Semiconductor Science and Technology, Vol. 29, Iss. 12, 2014-12 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)