Modeling of apparent activation energy and lifetime estimation in NAND flash memory

Publisher: IOP Publishing

E-ISSN: 1361-6641|30|12|125006-125011

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.30, Iss.12, 2015-12, pp. : 125006-125011

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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Abstract