Thermal characterization of DC and small-signal parameters of 150 nm and 250 nm gate-length AlGaN/GaN HEMTs grown on a SiC substrate

Publisher: IOP Publishing

E-ISSN: 1361-6641|30|12|125005-125014

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.30, Iss.12, 2015-12, pp. : 125005-125014

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