A model study of the role of workfunction variations in cold field emission from microstructures with inclusion of field enhancements

Author： Qiu H Joshi R P Neuber A Dickens J

Publisher： IOP Publishing

E-ISSN： 1361-6641|30|10|105038-105045

ISSN： 0268-1242

Source： Semiconductor Science and Technology, Vol.30, Iss.10, 2015-10, pp. : 105038-105045

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