Cleaved thin-film probes for scanning tunneling microscopy

Author： Siahaan T   Kurnosikov O   Barcones B   Swagten H J M   Koopmans B  

Publisher： IOP Publishing

E-ISSN： 1361-6528|27|3|3LT01-8

ISSN： 0957-4484

Source： Nanotechnology, Vol.27, Iss.3, 2016-01, pp. : 3LT01-8

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