Ion-beam analysis for cultural heritage on the AGLAE facility: impact of PIXE/RBS combination

Author： Salomon J.   Dran J.-C.   Guillou T.   Moignard B.   Pichon L.   Walter P.   Mathis F.  

Publisher： Springer Publishing Company

ISSN： 0947-8396

Source： Applied Physics A, Vol.92, Iss.1, 2008-07, pp. : 43-50

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