Watermark Formation on Bare Silicon: Impact of Illumination and Substrate Doping

E-ISSN： 1662-9779|2014|219|89-92

ISSN： 1012-0394

Source： Solid State Phenomena, Vol.2014, Iss.219, 2014-01, pp. : 89-92

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Impact of illumination and metal impurities on parameters of monosilicon solar cells

By Li F Hu W Liu C Ma Z Zhao L

Materials Technology: Advanced Performance Materials, Vol. 28, Iss. 6, 2013-11 ,pp. : 380-384

Maney Publishing

Access to resources Recommend Favorite

Effect of Nitrogen-Doping on the Properties of Radiation Defect Centers in FZ Silicon

Solid State Phenomena, Vol. 2015, Iss. 242, 2016-02 ,pp. : 279-7

Trans Tech Publications

Access to resources Recommend Favorite

Electrophoretic Deposition of Bilayer Based on Sacrificial Titanium Dioxide and Lead Zirconate Titanate on Bare Silicon Wafer

Key Engineering Materials, Vol. 2015, Iss. 654, 2015-08 ,pp. : 132-135

Trans Tech Publications

Access to resources Recommend Favorite

Confined and guided catalytic growth of crystalline silicon films on a dielectric substrate

IOP Conference Series: Materials Science and Engineering, Vol. 6, Iss. 1, 2009-11 ,pp. : 91-96

IOP Publishing

Access to resources Recommend Favorite

Formation of Silicon Carbide from Rice Hulls

By Moustafa S. F. Morsi M. B. El-Din A. Alm

Canadian Metallurgical Quarterly, Vol. 36, Iss. 5, 1997-12 ,pp. : 355-358

Maney Publishing

Access to resources Recommend Favorite