Study of Mobility Limiting Mechanisms in (11-20) 4H-SiC NO Annealed MOSFETs
Publisher: Trans Tech Publications
E-ISSN: 1662-9752|2015|821|713-716
ISSN: 0255-5476
Source: Materials Science Forum, Vol.2015, Iss.821, 2015-07, pp. : 713-716
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract