Analysis and Effects of Voids in Cylindrical Surrounding Double- Gate MOSFET for the RF Switches

Publisher： Bentham Science Publishers

E-ISSN： 2210-6820|7|2|243-251

ISSN： 2210-6812

Source： Nanoscience & Nanotechnology-Asia, Vol.7, Iss.2, 2017-08, pp. : 243-251

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