Opto-microwave experimental mapping of SiGe/Si phototransistors at 850 nm

Publisher: Cambridge University Press

E-ISSN: 1759-0795|1|6|469-473

ISSN: 1759-0787

Source: International Journal of Microwave and Wireless Technologies, Vol.1, Iss.6, 2009-12, pp. : 469-473

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Abstract