2D Electric field imagery in 4H-SiC power diodes using OBIC technique*

Author: Hamad Hassan  

Publisher: Edp Sciences

E-ISSN: 1286-0050|72|2|20101-20101

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.72, Iss.2, 2015-10, pp. : 20101-20101

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Abstract