Structural analysis of hydrogenated nanocrystalline silicon thin films as a function of substrate temperature during deposition

Author: Anutgan Mustafa   Uysal Sema   Anutgan Tamila  

Publisher: Edp Sciences

E-ISSN: 1286-0050|65|2|20301-20301

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.65, Iss.2, 2014-02, pp. : 20301-20301

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Abstract