Modeling of metal-ferroelectric-insulator-semiconductor structure considering the effects of interface traps

Author: Sun Jing   Shi Xiao Rong   Zheng Xue Jun   Tian Li   Zhu Zhe  

Publisher: Edp Sciences

E-ISSN: 1286-0050|70|3|30101-30101

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.70, Iss.3, 2015-06, pp. : 30101-30101

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