Depth profiling and morphological characterization of AlN thin films deposited on Si substrates using a reactive sputter magnetron

Author: Macchi Carlos   Bürgi Juan   García Molleja Javier   Mariazzi Sebastiano   Piccoli Mattia   Bemporad Edoardo   Feugeas Jorge   Brusa Roberto Sennen   Somoza Alberto  

Publisher: Edp Sciences

E-ISSN: 1286-0050|67|2|21301-21301

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.67, Iss.2, 2014-08, pp. : 21301-21301

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