Analysis of GaN cap layer effecting on critical voltage for electrical degradation of AlGaN/GaN HEMT

Author: Qu Shenqi   Wang Xiaoliang   Xiao Hongling   Wang Cuimei   Jiang Lijuan   Feng Chun   Chen Hong   Yin Haibo   Yan Junda   Peng Enchao   Kang He   Wang Zhanguo   Hou Xun  

Publisher: Edp Sciences

E-ISSN: 1286-0050|68|1|10105-10105

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.68, Iss.1, 2014-10, pp. : 10105-10105

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