Electron impact-ionization effects in UHV/CVD SiGe HBT's in the temperature range of 300 to 83 K

E-ISSN： 1764-7177|08|PR3|Pr3-103-Pr3-107

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.08, Iss.PR3, 1998-06, pp. : Pr3-103-Pr3-107

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