Dipolar relaxation effects in Al/SiO2/Si structures investigated by Transient Capacitance Spectroscopy

Publisher: Edp Sciences

E-ISSN: 0302-072x|45|10|493-499

ISSN: 0302-072x

Source: Journal de Physique Lettres, Vol.45, Iss.10, 1984-05, pp. : 493-499

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