EBIC investigations of thick SOI layers

Publisher: Edp Sciences

E-ISSN: 0035-1687|23|3|281-288

ISSN: 0035-1687

Source: Revue de Physique Appliquée (Paris), Vol.23, Iss.3, 1988-03, pp. : 281-288

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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