CHARACTERIZATION OF DISLOCATIONS AND THEIR EFFECTS IN SILICON DEVICE TECHNOLOGY

Publisher： Edp Sciences

E-ISSN： 0449-1947|44|C4|C4-437-C4-443

ISSN： 0449-1947

Source： Le Journal de Physique Colloques, Vol.44, Iss.C4, 1983-09, pp. : C4-437-C4-443

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