Publisher： Edp Sciences
E-ISSN： 0449-1947|50|C7|C7-295-C7-300
ISSN： 0449-1947
Source： Le Journal de Physique Colloques, Vol.50, Iss.C7, 1989-10, pp. : C7-295-C7-300
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
IN SITU X-RAY SCATTERING STUDIES OF CHEMICAL VAPOR DEPOSITION
Le Journal de Physique Colloques, Vol. 50, Iss. C7, 1989-10 ,pp. :
Access to resources
Recommend
AN X-RAY ANOMALOUS SCATTERING STUDY OF LIQUID GeBr
Le Journal de Physique Colloques, Vol. 46, Iss. C8, 1985-12 ,pp. :
Diffuse X-ray scattering from graded SiGe/Si layers
EPL (EUROPHYSICS LETTERS), Vol. 82, Iss. 6, 2008-06 ,pp. :
Small angle X-ray scattering and the structure of Ge-S and GeS
Le Journal de Physique IV, Vol. 03, Iss. C8, 1993-12 ,pp. :
Grazing incidence X-ray scattering from Ge/Si superlattices grown at low temperature
By Wu X.S. Hase T.P.A. Tanner B.K. Cheng H.H.
Surface Science, Vol. 548, Iss. 1, 2004-01 ,pp. :