A WALKING, SCANNING TUNNELING MICROSCOPE COMBINED WITH A FOCUSED ION BEAM

Publisher： Edp Sciences

E-ISSN： 0449-1947|50|C8|C8-497-C8-500

ISSN： 0449-1947

Source： Le Journal de Physique Colloques, Vol.50, Iss.C8, 1989-11, pp. : C8-497-C8-500

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

COMBINED FIELD ION AND SCANNING TUNNELING MICROSCOPE

By  

Le Journal de Physique Colloques, Vol. 48, Iss. C6, 1987-11 ,pp. : C6-79-C6-84

Edp Sciences

Access to resources Recommend Favorite

Manipulation of inverted and direct opals by a focused ion beam scanning electron microscope (FIB SEM)

By  

Journal of Physics: Conference Series , Vol. 126, Iss. 1, 2008-08 ,pp. : 242-245

IOP Publishing

Access to resources Recommend Favorite

FIELD ION MICROSCOPE AND ATOM-PROBE STUDIES OF SCANNING TUNNELING MICROSCOPE TIPS

By  

Le Journal de Physique Colloques, Vol. 49, Iss. C6, 1988-11 ,pp. : C6-55-C6-59

Edp Sciences

Access to resources Recommend Favorite

Field emission scanning electron microscopy combined with focused ion beam for rubbery material with nano-matrix structure

By  

Journal of Physics: Conference Series , Vol. 184, Iss. 1, 2009-08 ,pp. : 137-140

IOP Publishing

Access to resources Recommend Favorite

HIGH RESOLUTION ELECTRON BEAM INJECTION IN SEMICONDUCTORS USING A SCANNING TUNNELING MICROSCOPE

By  

Le Journal de Physique IV, Vol. 01, Iss. C6, 1991-12 ,pp. : C6-271-C6-275

Edp Sciences

Access to resources Recommend Favorite