Publisher: Edp Sciences
E-ISSN: 0449-1947|50|C8|C8-491-C8-495
ISSN: 0449-1947
Source: Le Journal de Physique Colloques, Vol.50, Iss.C8, 1989-11, pp. : C8-491-C8-495
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
COMBINED FIELD ION AND SCANNING TUNNELING MICROSCOPE
Le Journal de Physique Colloques, Vol. 48, Iss. C6, 1987-11 ,pp. :
FIELD ION MICROSCOPE AND ATOM-PROBE STUDIES OF SCANNING TUNNELING MICROSCOPE TIPS
Le Journal de Physique Colloques, Vol. 49, Iss. C6, 1988-11 ,pp. :
A WALKING, SCANNING TUNNELING MICROSCOPE COMBINED WITH A FOCUSED ION BEAM
Le Journal de Physique Colloques, Vol. 50, Iss. C8, 1989-11 ,pp. :
A SCANNING TUNNELING MICROSCOPE FOR SURFACE MODIFICATION
Le Journal de Physique Colloques, Vol. 47, Iss. C2, 1986-03 ,pp. :
HIGH VOLTAGE FIELD ION MICROSCOPE, ITS DESIGN AND FIELD CALCULATION
Le Journal de Physique Colloques, Vol. 48, Iss. C6, 1987-11 ,pp. :