Metal Oxide Transistors via Polyethylenimine Doping of the Channel Layer: Interplay of Doping, Microstructure, and Charge Transport

Publisher: John Wiley & Sons Inc

E-ISSN: 1616-3028|26|34|6179-6187

ISSN: 1616-301x

Source: ADVANCED FUNCTIONAL MATERIALS, Vol.26, Iss.34, 2016-09, pp. : 6179-6187

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Abstract