Polarimetry of light scattered by surface roughness and textured films and periodic structures in nanotechnologies: a new challenge in instrumentation and modeling

Publisher： Edp Sciences

E-ISSN： 2100-014x|5|issue|04001-04001

ISSN： 2100-014x

Source： EPJ Web of Conference, Vol.5, Iss.issue, 2010-06, pp. : 04001-04001

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