An application of Mueller matrix polarimetry for characterising properties of thin film with surface roughness

Author: Phan Quoc-Hung  

Publisher: Edp Sciences

E-ISSN: 2261-236x|32|issue|05006-05006

ISSN: 2261-236x

Source: MATEC Web of conference, Vol.32, Iss.issue, 2015-12, pp. : 05006-05006

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Abstract