Optical evaluation of doping concentration in SiO₂ doping source layer for silicon quantum dot materials

Author： Zhang T. Perez-Wurlf I. Berghoff B. Suckow S. Conibeer G.

E-ISSN： 2105-0716|2|issue|25001-25001

ISSN： 2105-0716

Source： EPJ Photovoltaics, Vol.2, Iss.issue, 2011-10, pp. : 25001-25001

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