Multi-scale analysis by SEM, EBSD and X-ray diffraction of deformation textures of a copper wire drawn industrially

Publisher： Edp Sciences

E-ISSN： 2261-236x|5|issue|04004-04004

ISSN： 2261-236x

Source： MATEC Web of conference, Vol.5, Iss.issue, 2013-09, pp. : 04004-04004

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Prediction of grain deformation in drawn copper wire

By  

MATEC Web of conference, Vol. 21, Iss. issue, 2015-08 ,pp. : 02009-02009

Edp Sciences

Access to resources Recommend Favorite

Scale transition models and X-ray stress analysis

By François M.  

Revue de Métallurgie, Vol. 100, Iss. 12, 2010-03 ,pp. : 1137-1149

Edp Sciences

Access to resources Recommend Favorite

DIRECT MULTI‐SCALE ORDINATION WITH CANONICAL CORRESPONDENCE ANALYSIS

By  

Ecology, Vol. 85, Iss. 2, 2004-02 ,pp. : 342-351

John Wiley & Sons Inc

Access to resources Recommend Favorite

Characterisation of LD slag fines by X-ray Diffraction

By Ashrit Shrenivas   Banerjee Pradip K.   Ghosh Tamal K.   Rayasam Venugopal   Nair Udayabhanu G.  

Metallurgical Research & Technology (formerly Revue de Métallurgie), Vol. 112, Iss. 5, 2015-09 ,pp. : 502-502

Edp Sciences

Access to resources Recommend Favorite

Residual stresses in alumina-chromium composites: micromechanical analysis and study by X-ray diffraction

By Geandier G.   Weisbecker P.   Denis S.   Hazotte A.   Mocellin A.   Lebrun J.-L.   Elkaim E.  

Revue de Métallurgie, Vol. 100, Iss. 12, 2010-03 ,pp. : 1163-1172

Edp Sciences

Access to resources Recommend Favorite