A Coupled Field Multiphysics Modeling Approach to Investigate RF MEMS Switch Failure Modes under Various Operational Conditions

Author： Sadek Khaled Lueke Jonathan Moussa Walied

Publisher： MDPI

E-ISSN： 1424-8220|9|10|7988-8006

ISSN： 1424-8220

Source： Sensors, Vol.9, Iss.10, 2009-10, pp. : 7988-8006

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