Hardened Flip-Flop Optimized for Subthreshold Operation Heavy Ion Characterization of a Radiation

Author: Chavan Ameet   Palakurthi Praveen   MacDonald Eric   Neff Joseph   Bozeman Eric  

Publisher: MDPI

E-ISSN: 2079-9268|2|2|168-179

ISSN: 2079-9268

Source: Journal of Low Power Electronics and Applications, Vol.2, Iss.2, 2012-05, pp. : 168-179

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