A Review on Resistive Switching in High-k Dielectrics: A Nanoscale Point of View Using Conductive Atomic Force Microscope

Author： Lanza Mario  

Publisher： MDPI

E-ISSN： 1996-1944|7|3|2155-2182

ISSN： 1996-1944

Source： Materials, Vol.7, Iss.3, 2014-03, pp. : 2155-2182

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