Stability of Single Electron Devices: Charge Offset Drift

Author: Stewart M. D.   Zimmerman Neil M.  

Publisher: MDPI

E-ISSN: 2076-3417|6|7|187-187

ISSN: 2076-3417

Source: Applied Sciences, Vol.6, Iss.7, 2016-06, pp. : 187-187

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Abstract