The Evolution Behavior of Defects in the Nanofilms of W/Cu and W Probed by Doppler Broadening Positron Annihilation Spectroscopy

Publisher： Trans Tech Publications

E-ISSN： 1662-9507|2017|373|104-107

ISSN： 1012-0386

Source： Defect and Diffusion Forum, Vol.2017, Iss.373, 2017-04, pp. : 104-107

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