Vacancy-Type Defects in GaN for Power Devices Probed by Positron Annihilation
Publisher: Trans Tech Publications
E-ISSN: 1662-9507|2017|373|183-188
ISSN: 1012-0386
Source: Defect and Diffusion Forum, Vol.2017, Iss.373, 2017-04, pp. : 183-188
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Abstract