Probabilistic risk bounds for the characterization of radiological contamination

Author: Blatman Géraud   Delage Thibault   Iooss Bertrand   Pérot Nadia  

Publisher: Edp Sciences

E-ISSN: 2491-9292|3|issue|23-23

ISSN: 2491-9292

Source: EPJ Nuclear Sciences & Technologies, Vol.3, Iss.issue, 2017-07, pp. : 23-23

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Abstract